DocMemory
 
Home
News
Products
Shop
Memory
Corporate
Contact
 

News
Industry News
Publications
CST News
Help/Support
Member Area
Tester Brochure
Demo Library
Software
Tester FAQs

biology medicine news product technology definition

Sunday, August 19, 2018
CST News Release
Email ArticlePrinter Format PreviousNext

100Mhz SDRAM Testing now available for the Eureka Tester


Friday, December 05, 1997

CST, Inc., a leading worldwide manufacturer of memory testers and handlers, announces the new 100Mhz Eureka Synchronous (SDRAM) DIMM Tester. With its 100Mhz, 66Mhz and 33Mhz selectable universal clock speed, the Eureka Advanced SIMM/DIMM Tester now offers the fastest SDRAM test cycles in coherent with the new Intel PC System board. Its multiple address and synchronous clock switches is capable of testing 2 clock/4 clock, unbuffer, buffer/registered SDRAM modules for both PCs and workstations. Tests also include burst test and parametric leakage test.

By: CST Staff
Copyright 1997 CST, Inc. All Rights Reserved

Email ArticlePrinter Format PreviousNext
Latest CST News
MS-100D DIE Sorting Tester5/5/2017
CST Start to Deliver Eureka 2400 DDR4 Memory Tester4/5/2016
CST Enables Memory Market with New DDR4 Tester8/28/2014
CST launch Eureka2s Mobile Memory Tester for testing Multi-Chip-Package (MCP) memory.12/16/2013
CST to unveil the Dual Test Socket 2133Mhz DDR3 DIMM/SODIMM Tester at the Semicon Taiwan Show.8/13/2013
CST Inc first to ship DDR4 DIMM/SODIMM Memory Module SPD EEPROM Programmer8/8/2013
CST launch Improved DDR4/DDR3 Server DIMM Memory Burn-in System at Semicon Taiwan8/1/2013
CST unveil Dual Test Socket DDR3 DIMM/SODIMM Tester2/20/2013
High-Performance Advantest Automatic Handler + CST DDR3 & Mobile DRAM Chip Testers for Total Testing Solution.10/15/2012
CST unveil the DDR3 BGA Chip Test Handler at Semicon Taiwan 201210/15/2012

CST Inc. Memory Tester DDR Tester
Copyright © 1994 - 2018 CST, Inc. All Rights Reserved