DocMemory
 
Home
News
Products
Shop
Memory
Corporate
Contact
 

News
Industry News
Publications
CST News
Help/Support
Member Area
Tester Brochure
Demo Library
Software
Tester FAQs

biology medicine news product technology definition

Thursday, April 26, 2018
CST News Release
Email ArticlePrinter Format PreviousNext

Lowest Cost Stack DRAM Test Solution


Thursday, November 04, 1999

NEWS FOR IMMEDIATE RELEASE

Lowest Cost Stack DRAM Test Solution

CST announces the new stack chip test adapter built on the low cost SP3000 tester platform.

As OEM computer manufacturers introduce their new generation server for Internet and Intranet, requirement for large size memory modules goes up with them. These large size modules are usually populated with 256Mbit or 512Mbit stack chips. These expensive stack chips consists of two normal TSOP DRAM chips stacking on top of one another through a chip scale substrate. This stacking has caused the chip size to swell beyond a regular TSOP test socket. Manufacturers are usually resolving to custom test sockets that cost over a thousand dollars.

This new adapter utilizes standard off-the-shelf test contact elements to guarantee low initial cost as well as low maintenance cost. The heavily gold plated contact elements provide over 5,000 cycles of testing. When the elements wear out, it can be easily replaced on the spot. Clamp-shell construction allows sure contact and high frequency test integrity.

The CST SP3000 tester together with the stack chip adapter allows at-frequency test of the high value stack chips. Operating frequencies are selectable at 133Mhz, 100Mhz and at 66Mhz. It can unveil stack assembly problems as well as functional problems on the DRAM.

This single socket stack DRAM adapter is priced at $995. It can also be purchased together with the SP3000 base tester for $2,295.

By: newsgroup
Copyright 1999 CST, Inc. All Rights Reserved

Email ArticlePrinter Format PreviousNext
Latest CST News
MS-100D DIE Sorting Tester5/5/2017
CST Start to Deliver Eureka 2400 DDR4 Memory Tester4/5/2016
CST Enables Memory Market with New DDR4 Tester8/28/2014
CST launch Eureka2s Mobile Memory Tester for testing Multi-Chip-Package (MCP) memory.12/16/2013
CST to unveil the Dual Test Socket 2133Mhz DDR3 DIMM/SODIMM Tester at the Semicon Taiwan Show.8/13/2013
CST Inc first to ship DDR4 DIMM/SODIMM Memory Module SPD EEPROM Programmer8/8/2013
CST launch Improved DDR4/DDR3 Server DIMM Memory Burn-in System at Semicon Taiwan8/1/2013
CST unveil Dual Test Socket DDR3 DIMM/SODIMM Tester2/20/2013
High-Performance Advantest Automatic Handler + CST DDR3 & Mobile DRAM Chip Testers for Total Testing Solution.10/15/2012
CST unveil the DDR3 BGA Chip Test Handler at Semicon Taiwan 201210/15/2012

CST Inc. Memory Tester DDR Tester
Copyright © 1994 - 2018 CST, Inc. All Rights Reserved