DocMemory
 
Home
News
Products
Shop
Memory
Corporate
Contact
 

News
Industry News
Publications
CST News
Help/Support
Member Area
Tester Brochure
Demo Library
Software
Tester FAQs

biology medicine news product technology definition

Sunday, February 25, 2018
Memory Industry News
Email ArticlePrinter Format PreviousNext

Volkswagen senior manager to get jail term


Thursday, December 07, 2017

Lawyers for a Volkswagen senior manager say his U.S. prison sentence shouldn't exceed 40 months for his role in the automaker's diesel emissions scandal.

Oliver Schmidt will be sentenced Wednesday in Detroit federal court. The U.S. government is asking a judge to send him away for seven years.

VW used sophisticated software to cheat emissions rules on nearly 600,000 U.S. vehicles. Schmidt led VW's engineering and environmental office in Michigan from 2012 to early 2015.

Prosecutors say Schmidt concealed the software tricks to California regulators while offering "bogus" explanations of any differences in emissions. But his lawyers point out that he wasn't involved when the scheme was hatched years earlier by the company.

VW pleaded guilty as a corporation in March and agreed to pay billions of dollars in fines.

By: DocMemory
Copyright 2017 CST, Inc. All Rights Reserved

Email ArticlePrinter Format PreviousNext
Latest Industry News
Intel to collaborate with Chinese mobile chip maker2/23/2018
Qualcomm adopts 7nm Samsung process on Snapdragon 5G chipsets2/23/2018
Irish chipmaker received funding to expand ultra-wideband wireless technology 2/23/2018
Broadcom lower bid to offset Qualcomm's increased NXP offer2/23/2018
Micron announce plans for quadruple-level cell (QLC) flash memory2/22/2018
Intel plans to invest $5 billion in expanding production in Israel2/22/2018
Apple moves to deal direct with colbalt miners2/22/2018
Apple regains lead on both smartphone revenue and units sold2/22/2018
Samsung offers 30TB SSD2/21/2018
NXP to launch GreenBox development platform. for EV and plugged in cars2/21/2018

CST Inc. Memory Tester DDR Tester
Copyright © 1994 - 2018 CST, Inc. All Rights Reserved