Friday, May 5, 2017
MS-100D DIE Tester
CST Inc., a Memory Tester Company has announced its New MS-100D DIE Sorting Tester and have started deploying hundreds of units at several major DIE Sorting Manufacturers world-wide. MS-100D has a very good architecture, with different probe card the same tester is able to test almost all DRAM DIE on the market, specially Mobile Low Power DRAM: LPDDR2, LPDDR3 & LPDDR4.
Innovative DIE Sorting Solution
MS-100D is cost effective, high performing DIE Sorting solution. With changeable probe card MS-100D is able to test various DIE: LPDDR4/3/2, DDR4/3. So far we already provided customer below DIE solution
Fast Development Time
- MS-100D is FPGA-Based tester, CST has more than 30 years’ experience on memory testing, and has memory controller for almost all DRAN devices on the market.
- Simple Probe Card design - only probe and connector
- Lead-time for a new DIE is 4-6 weeks
Fast test time, high FT good percentage
Support DQ BIN Sorting
Small form-factor size and works with different probe card station
Easy to align Probe & DIE PAD
Easy to us.
- MS-100D has Start Button, 1-click-to-run
- Detail & clear result display
For further information, visit www.simmtester.com or call our Sales at (972)241-2662 x312.
Address: 2336 Lu Field Road , Dallas, Texas 75229 USA
Tel : (972)-241-2662
Fax : (972)-241-2661
Email : firstname.lastname@example.org
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