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CST News Release

100Mhz SDRAM Testing now available for the Eureka Tester


Friday, December 5, 1997 CST, Inc., a leading worldwide manufacturer of memory testers and handlers, announces the new 100Mhz Eureka Synchronous (SDRAM) DIMM Tester. With its 100Mhz, 66Mhz and 33Mhz selectable universal clock speed, the Eureka Advanced SIMM/DIMM Tester now offers the fastest SDRAM test cycles in coherent with the new Intel PC System board. Its multiple address and synchronous clock switches is capable of testing 2 clock/4 clock, unbuffer, buffer/registered SDRAM modules for both PCs and workstations. Tests also include burst test and parametric leakage test.

By: CST Staff
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