Home
News
Products
Corporate
Contact
 
Wednesday, November 27, 2024

News
Industry News
Publications
CST News
Help/Support
Software
Tester FAQs
Industry News

Toshiba samples 512Gbit 3D NAND with 64 layers


Friday, February 24, 2017

Toshiba is sampling 64-layer 3-bit-per cell 512Gbit 3D NAND.

Mass production is scheduled for H2.

In April Toshiba plans to sample a  1Tbyte product which stacks 16 512Gbit die in a package.

For the 512Gbit device, Toshiba deployed a 64-layer stacking process to realize a 65% larger capacity per unit chip size than the 48-layer 256Gbit (32Gbyte) device, and has increased memory capacity per silicon wafer, reducing the cost per bit.

Toshiba’s already mass produces 64-layer 256Gbit devices.

By: DocMemory
Copyright © 2023 CST, Inc. All Rights Reserved

CST Inc. Memory Tester DDR Tester
Copyright © 1994 - 2023 CST, Inc. All Rights Reserved