Expanding the realm of test capabilities currently available for memory devices, Milpitas, Calif.-based test system provider Credence Systems Corp. unveiled Thursday its Kalos 2 Hex (K2 Hex) IC test system for current and next-generation non-volatile memory and embedded memory devices.

The K2 Hex is hardware and software compatible with the Kalos 2 and Personal Kalos 2 test tools. Multiple K2 Hex systems have already been installed for testing complex embedded memory devices, Credence also reported.

In addition to the interchangeability between device types, the K2 Hex can switch between multi-site testing and high pin count testing. Further cost efficiencies can be realized for customers moving from the popular Kalos 1 Hex (K1 Hex) test system to the K2 Hex as the probe cards are fully compatible between the two systems.

Similar device programs and tools further ease the transition from Kalos 1 with total cost-of-test minimized with high throughput, small footprint and low power consumption.

The test system also contains Credence’s Tester-on-a-Chip (ToC) architecture, software controlled configurations, hardware accelerated redundancy analysis and scan hardware and has a 200MHz effective test rate and four formatted edges per cycle.

The K2 Hex system supports engineering, characterization and production test with a single platform.

“The Kalos 2 Hex system provides customers the flexibility to test a variety of memory devices and logic devices with embedded memory,” said Dave Ranhoff, president and CEO of Credence, in a statement.

“With the versatile K2 Hex architecture, switching between test lots of different device types is easily accomplished,” he continued. “Functionality is just one of the many cost saving benefits of this test system."

By: DocMemory
Copyright © 2023 CST, Inc. All Rights Reserved