The Magnum Grande, integrated with the TechWing TW-380 test handler, is a parallel test solution capable of testing 720 NAND flash devices at one time — more than double than previous products.

With up to 7,680 I/O pins and 960 sites, the twelve-chassis system is said to have a 25 percent test cost reduction over last year's 320-site configuration.

Each site assembly contains all of the data generation, error processing, timing and DC resources required to test a wide variety of devices, including both NAND and NOR flash memories.

Each assembly also includes an embedded 1.2-GHz PC for high efficiency and local control of the test process. Magnum Grande systems are available today at prices starting at less than $400 per-pin.

"We believe Grande has raised the bar to a new level in package test," said Robin Adler, CEO of Nextest (San Jose, Calif.). "As ASP's continue to erode in flash, collaboration with customers and other equipment providers is crucial as we develop solutions that drive down test costs."

By: DocMemory
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