Wednesday, September 1, 1999
Introduction
Since the publishing of my last article "Defining Tomorrow's Memory
Module Tester" (EE Magazine, March 99), I
have received a lot of calls. The bottom line question is always "Can my existing
memory tester be upgraded to test Rambus?" These calls came from a wild spectrum of
companies covering the microprocessor manufacturers to the memory manufacturers and to the
small system integrators. This have prompts me to write this article as an extension to
bring you into a conclusion. Readers are recommended to read the previous article as
mention above in concurrence to gain the fullest understanding.
SDRAM DIMM, RAMBUS RIMM Comparison
Perhaps, we should first look at the different working mechanism
between an SDRAM DIMM and a Rambus RIMM module.
- Both systems are based on control clocking to precisely position
the retrieved data.
- The SDRAM DIMM works on a 100Mhz clock (PC100) while the RIMM works
on a 400Mhz clock.
- The SDRAM DIMM works on single data rate while the RIMM works on
both edges of the clock to provide double data rate at two times of the clock frequency
(800Mhz data).
- The SDRAM DIMM provides 64bits of data in parallel at each clock
while the RIMM produces packets of 32bits data (at double clock edge) at each Rambus clock
cycle. Therefore, it requires 2 Rambus clock cycles to get the same 64bits of data.
- SDRAM DIMM works on 64 data lines while the RIMM only work with a
bus of 16 data lines.
- Rambus use a packetized bus reduction concept to minimize the bus
width (number of signal wires) at the trade-off of increased data frequency.
- Therefore, the RIMM can be illustrated as a serial streaming
technology instead of a parallel technology like the SDRAM DIMM.
Figure 1: It takes 2 Rambus clock cycles at 400Mhz to get the
64bits that an SDRAM will get in only one slow clock cycle 100Mhz.
The Basic SDRAM DIMM Tester Architecture
Figure 2 shows the typical SDRAM DIMM tester block diagram. It is
a 64bit (72bit including ECC) tester built with 72bit algorithmic pattern generator, 72bit
data comparitor, and 72bits of data driver/receiver. In additional, there is a set of
address counter, control signal generator, refresh timer, and also a timing clock
generator. Of that, the most complex unit is the algorithmic generator and the comparator.
Figure 2, Basic SDRAM DIMM tester
RIMM Tester built on the SDRAM Tester concept
In order to build a Rambus RIMM tester, a "RAC" (Rambus
ASIC Cell) chip is required to translate the lower speed data (100Mhz) to the 800Mhz data
rate. This custom chip acts as a "gear box" that translates the PC100 signals
with a 4:1 gear ratio to four times the clock frequency and eight times the data rate.
This ASIC also provides the voltage level translator to 1.8V. Since the Rambus channel
works with both clock edges, twice the data from the PC100 signal generator is needed to
keep up with the Rambus execution speed. That means 144 bits of data is required at the
input side of the "RAC" chip. This translates into two PC100 SDRAM DIMM testers
with time synchronization circuitry (hand shakes). Figure 3 shows the block diagram of the
tester.
Figure 3, Rambus RIMM tester architecture
The Cost Factors
- The tester architecture requires 2 of the SDRAM DIMM testers with
hand shake circuits. This design doubles the cost of the base signal generator.
- The "RAC" circuit is a license technology from Rambus,
Inc, a one-time license fee plus per piece royalty payment is required.
- Additional cost of development for the custom "RAC" chip
including tester features. This can vary between $300,000 to $500,000 up front.
- Complexity on PCB layout of the Rambus channel. Simulation analysis
is required to minimize reflection. This leads to additional engineering cost.
- Cost of Rambus test socket. Presently, the only test socket
available for testing RIMM starts at $3,500.
Conclusion
Judging from the cost and complexity factors, the upgrade cost
from a PC100 SDRAM DIMM tester to a RIMM tester would likely cost many times more than the
original PC100 tester. A whole new generation of memory tester with higher throughput
would probably better fulfill the needs of the industry. Besides, the same architecture in
Figure 3 would apply to alternate technologies like DDR or PC133 simply by replacing the
"RAC" chip with the appropriate interface ASIC.
By: Cecil Ho Copyright © 2023 CST, Inc. All Rights Reserved
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