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CST
is proud to present the next generation of Eureka tester capable of
testing DDR,DDR2 & DDR3 in blazing speed. The Eureka2 is the fourth
generation Bench-Top DIMM / SODIMM test system specifically designed
for high-volume memory distributors, memory module manufacturers,
memory module design engineers, DRAM Test Labs and other PC manufacturers
.
With
progressive engineering and state-of-the-art technology, the Eureka-2
memory test system was created to be the industry testing standard for
the next decade. Designed with R&D engineers, QA/QC engineers and
module manufacturers in mind, the Eureka-2 's rugged, heavy duty construction
was developed to endure the rigors of high volume testing
The
Eureka2 Advanced Memory Tester can support DDR1, DDR2 & DDR3 memory
with a change of optional adapters.
Future memory such as Nand Flash, Nor Flash and MCPs will be offer on
the Eureka2 tester.
With
the new DDR3 Test Solution,
Eureka2 DDR3 tests adapter supports testing DDR3 SDRAM DIMM modules
starting from 800Mhz ~ 1400Mhz Data Rate. Leakage testing option
is offered as a standard DC parametric feature test for all DDR,
DDR & DDR3 module.
CST
will offer a DDR3 Test Solution
on the Eureka2 with an optional adapter which will support DDR3
DIMM module from 800Mhz to 1333 Mhz data-rate.
The
Eureka-2 is indeed, the most versatile and powerful memory module tester
for the module manufacturers and distributors. Additional future optional capability
includes Flash testing, DDR2 TSOP/BGA Chips, DDR2 BGA Chips, DDR3 BGA
Chips & MCP testing
will be available.
Advanced
Test Algorithms
The
Eureka-2 performs fast functional test ensuring module work in the final
system environment. Multiple user Defined test patterns are used to detect
shorts and opens. Comprehensive test cycles out soft failures including
single cell failure, cross-cell-contamination, intermittent failure as
well as timing and noise related errors.
DC-Parametric
Test
Leakage testing is
offered as a standard feature and use for semiconductor
leakage testing characteristics. The Eureka2 test can detect minute leakage current that can
lead to infant mortality on any type of DRAM chips.
SPD
Programming
The tester is built-in
with SPD (serial presence detect) programmer to program and verify SPD
contents on the same pass as the module is being tested.
Enhancement
Features
A few enhancement
features are provided to streamline test accuracy. These are chip-heating,
voltage bouncing, loop test, adjustable timing parameters (selected),
alterable refresh mode and cycle, refresh test, 7- ICC measurement,
as well as Shmoo Plot and error capture capabilities. It also supports
buffered or unbuffered modules with parity and ECC bits.
Ease
of Use
This bench top DIMM/SODIMM
tester is designed for all situations. While for the high volume production
setting, an ideal solution is to interface the Eureka-2 with CST's new
RoboFlex-1 and RoboFlex-2 Automatic DIMM/SODIMM Handler for hands-free
testing. In all cases, the latest software enhancement and upgrade can
be downloading from CST website at no additional charge.
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