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Tuesday, December 11, 2018

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Eureka General Information

Q. Can you tell me more above the Eureka Memory Tester ?

A. The Eureka is an all-in-one universal memory tester capable of testing SDRAM, DRAM, SRAM, ARAM, Cache and Flash memories with optional test accessories.

Equipped with “High speed test technology” combine with analog pin drivers for voltage changes and a waveform editor for timing parameters adjustment. It provides a leakage test option to detect chips with current leakage problem.

It also has special SIMM Draw Editor, which provides pictorial module layout to pin-point the bad chips, which makes the troubleshooting and diagnosis work a lot easier.

Many other functions such as preheating, test looping, ICC measurement and testing, voltage bouncing and more are available Test memory coverage up to 4 GIGA word and is equipped with 40 bit width data I/O with an option to upgrade to 160 bits. All in all, the Eureka provides close to ATE performance at an affordable price.

The Eureka Tester can be attached to an optional DM718 Automatic Handler and labeler to provide a total hands-free, automated mass production test solution.

A few of the latest adapters built to work with the Eureka are as follows:

SDRAM3 PLATFORM
– is used for testing all SDRAM Modules. This newly designed 80 bit platform is used to test Synchronous DRAM modules. This SDRAM platform memory module testing is capable of providing precision synchronous clocking, burst mode exercising, interleaving and latency testing , the frequency range is 66Mhz , 100Mhz & 133Mhz . Currently, the available adapters to work with this SDRAM platform are adapters for 168pin / 144pin, unbuffered JEDEC SDRAM module. Other Non Jedec adapters such as 100 pin, 200 pin, 244 pin and 278 pin adapters are also available on the 100mhz platform.


160BIT PLATFORM
– is used for testing EDO/PAGE MODE DRAM Modules. This is a platform to multiplex the 40 data bits to 160 bits in order to test modules with 64 bits, 72 bits, 80 bits and 144bits and etc. The adapters that work with this platform are the 168 pin DIMM with JEDEC, Apple and SPARC 5 standards, Toshiba 410/610 series, IBM 760 series, SPARC 10/20, JEDEC 144pin SODIMM and etc.

CACHE ADAPTERS

– is used to Test Cache Memory Modules

CST’s cache platform supports the level 2 cache modules for both asynchronous and pipeline burst modes. Its dual voltage generator allows simultaneous testing of both 3.3V cache RAM and 5.0V Tag Ram. There are a few different standards of cache modules depending on the system boards chip sets used. Currently, CST’s has 4 different kinds of adapters to support these various cache modules. EK-Cache1 is for testing modules used with Intel’s Triton and SIS/OPTI chip set. EK-Cache2 adapter is for testing modules used with Intel’s Neptune chip set. EK-Cache3 adapter is for testing the modules used in the Apple Power PC. While EK-Cache4 is for testing the modules used in the DEC computer.




Q. What accessories do I need to test 168 pin DRAM DIMM and 168pin SDRAM DIMM?

A. To test the 168 pin DRAM DIMM-EDO, you need the Eureka universal base tester it comes with an optional 160 bit platform and adapter. It is capable to test most 168 pin, 144 pin , 72pin EDO and Page mode DIMM module with a change of adapter.
You cannot test SDRAM DIMM using this adapter. For testing 168pin SDRAM DIMM module, you will require an optional SDRAM2 Platform and adapter. This adapter is capable of testing both the 66Mhz &100Mhz SDRAM DIMM modules at real frequency. 160 bit DRAM Platform adapter and platform is not capable for testing SDRAM DIMM. The Eureka checks for assembly open and shorts on the module using the “ Walk address” and “Walk data” test pattern.
For more detail testing coverage , the Eureka has “Marching & Checkerboard” test to check for dram cell related faults.
The Eureka can also Auto-Identify most JEDEC standard module, size/capacity, device configuration, access time (speed), parity / non parity/ ECC and voltages.

Q. What are the test coverage for Eureka Tester ?

A. * The Eureka detect assembly open and shorts on the module using the “ Walk address” and “Walk data” test pattern.
* For more comprehensive detail test coverage , the Eureka has “Marching & Checkerboard” test to check for dram cell related faults.
* The Eureka also Auto-Identify JEDEC standard module for size/capacity, device configuration, access time (speed), parity / non parity/ ECC and voltages.

Q. What are the features of the tester?

A. For DRAM module testing , the Eureka is equipped with the following test features:

* Walk Address Test - checks for open/short on address pins and bad address decoder.

* Walk Data Test - checks for open/short data bits

* Marching & Checkerboard Test – checks for bad cells, decoder interaction problem.

* Pre-heat Test – checks for reliability during chip warming –up.

* Voltage bouncing test – checks for modules with noise related problem

* Loop Test – to simulate module burn-in situation

* Leakage Test – to check for assembly shorts and memory cell faults



For SDRAM Testing:

* Walk Address Test - checks for open/short on address pins and bad address decoder.

* Walk Data Test - checks for open/short data bits

* Marching & Checkerboard Test – checks for bad cells, decoder interaction problem.

* Burst Test – checks for faulty chip that fail to read and write during consecutive clock cycles.

* Chip Select Test – checks for assembly shorts and open on the CS pins

* DQM Test – checks for SDRAM chip input and output masking ability

* WP Test – check for module that is PC-100 Intel compliance.

* Leakage Test – to check for assembly shorts and memory cells faults.

Q. How accurate is the Eureka Tester in testing and fault detection ?

A. The Eureka is capable to detect 99% of memory fault.

The access time (Speed) is 1 nanosecond in resolution.

The Eureka is capable of identifying 99% of most JEDEC 72/168pin module.

It is the tester used by most memory manufacturers.

Q. How fast can the module be tested with the Eureka Tester?

A. The Eureka is able to test a 32MB – 168pin DRAM DIMM module in 2 second for quick test (open and short test).


A detail comprehensive test (open/short, marching test ) is takes under 10 sec to complete as compared to other testers that will take 25 sec.


The SDRAM-133Mhz adapter can do a detail test for a 32Mb PC-100 DIMM module in less than 8 sec flat as compared to other tester that will take more than 30sec.

Q. Can it automatically ID any module?

A. With the correct test platform and adapter, you will be able to detect the memory size, number of data bits, access time (speed), voltages

Q. Can I use it to test PC-100 & PC-133 modules?

A. * Yes, you need to use the 133Mhz – SDRAM3 Platform and adapter, this combination of platoform & adapter will test both the 100 and133Mhz SDRAM DIMM module. A SDRAM3 Platform & 133Mhz label is printed on the adapter casing cover for easy identification.

*You can still also test a 66Mhz SDRAM DIMM module with this adapter, as the frequency on the tester is user selectable from the software.

Q. How is the Eureka compared with the competition ?

A. The Eureka is the most preferred tester used by many SIMM/DIMM manufacturer / OEM customer such as HP, Micron, Digital and many more.

For product feature – the Eureka is very easy to upgrade by exchanging different test platform and adapters.

Latest software can be updated by PC-Download from the Internet.

User friendly test menu for “non –technical user”.

Continuous technical support for all CST product installed in field.

Q. What do I need to operate the Eureka Tester with ?

A. The Eureka require a PC system (not included) for full operationes - it is connected to a PC by using the Eureka interface card and software included withthe Eureka Tester.

Q. Is there an option for the tester to log and print test results?

A. * Yes, the Eureka uses the PC printer port that can be connected to any printer with a printer cable.
* The fail results will be printed out upon enabling the print function.
* Software allows for management control function with ability to capture and log results.

Q. How can I update my Eureka tester for future release?

A. You can upgrade the tester without a change of the base tester, all you need to purchase is the appropriate test platforms and adapters with to the base tester.
You can download the latest software from the Internet.

Q. Does the Eureka tester Read/ Program the EEPROM (SPD) on the module?

A. The SDRAM Platform & 160 bit Dram Platform with adapters have built in programmer circuitry which are capable of reading editing and programming the EEPROM found on the memory module.

Q. Does the Eureka test Notebook module

A. Yes, the Eureka is capable of testing Notebook memory modules.


For DRAM 72 pin and 144 pin SODIMM module, you will require the EK-72/144 pin SODIMM DRAM adapter with 160 bit DRAM platform.


For SDRAM 144pin SODIMM, you will require the EK-SODIMM 144 pin SDRAM adapter with the SDRAM Platform.


For PCMCIA Dram card module, you will require the EK-PCMCIA Card Adapter with the 160 bit platform.

Q. Does the Eureka test DRAM chips

A. Yes , the Eureka is capable of testing both DRAM chips and SDRAM chips For DRAM chip testing, you will require the EK-SOJ DRAM adapter use with the 160bit DRAM Platform. For SDRAM chip, you will require the TSOP SDRAM chip adapter used with the SDRAM2 Platform.

Q. Does the Eureka Tester test 5V chips as well as 3.3V chips

A. The Eureka is capable of testing both the 3.3V and 5V DRAM chip.

Q. Does the Eureka test Cache & Flash Module

A. Yes, Flash and Cache Platform and test adapter are available on the Eureka. As there are varying standards on these modules, please contact CST for pin compatibility or customisation.

Q. Can the Eureka tester be upgraded to test Rambus modules ?

A. Yes CST presently delivering a 1st Pass RIMM Eureka tester, which will enable open / short test and parametric option only.

The Eureka RIMM tester will not be capable of testing full functional test. Please call CST at (972)-2412662 for pricing.

Q. Will the Eureka be capable of supporting the 266Mhz DDR memory ?

A. Yes - CST is currently developing a new DDR Platform with a seperate 184pin DIMM adapter. The test functions are similar to the SDRAM test functions. The Eureka DDR test solutions will be available Q4 - 2000.


Eureka Technical Information

Q. I having problem testing PC133 168pin DIMM module on the Eureka tester ?

A. If you are using SDRAM1 platform with SDRAM1 Adapter – you will face some problem testing PC100 & PC133 Modules.

The SDRAM1 was design for testing 66Mhz or PC66 SDIMM only – using this platform to test PC100 or PC133 DIMMs will yield incorrect test results.

To test PC133/PC100 SDRAM DIMM – you need to use EK-SDRAM2-Platform with EK-SDRAM2-Adapter or EK-SDRAM3-Platform with EK-SDRAM3-Adapter to correctly identify a PC133/PC100 DIMM module. The SDRAM2 Platform can be also used to test PC66 SDIMM.

To test PC133 SDRAM DIMM – you need to use the latest SDRAM3 platform and SDRAM3 Adapter to correctly identify a PC133 DIMM module. The SDRAM3 Platform can be also used to test PC100 & PC66 SDIMM.

Q. What is the difference between EK-SDRAM2 & EK-SDRAM3 Test Solution?

A. The main difference between the SDRAM3 and SDRAM2 are as follows:

SDRAM3 Test speed is 2X faster than SDRAM2, it is able to perform a comprehensive full test for 32Mb SDRAM in under 8 sec

SDRAM3 is a self calibrating platform using DLL technology

SDRAM3 is capable of detecting and testing PC133 DIMM

SDRAM3 test full 80bits in parallel.

SDRAM2 requires an analog calibration- by adjusting a delay line.

Q. The SDRAM3 Test Hardware does not Identify or test my SDRAM modules?

A. A fully functional SDRAM3 will Auto-Identify most JEDEC standard module, size/capacity, device configuration, access time (speed), parity / non parity/ ECC and voltages.

Check all test connector for firm connection.

If you are not able to continue testing– you need to perform a one time calibration for the tester.

To perform the CALIBRATION, please refer to the SDRAM3 User Manual -Page 12 for the CALIBRATION PROCEDURE. This step need only be carried out once.

After calibration – if the tester is still not able to identify or test several different known good SDRAM DIMM – you need to contact CST for a RMA number and to send back the tester for repair.

Q. How do I interpret the failure message that is shown on software for the module that I am testing?

A. For DRAM module testing , if the Eureka fail the following test :

Walk Address Failure - checks and detect open/short on address pins and bad address decoder.

Walk Data Failure - checks and detect open/short on data bits

Marching Failure – checks and detect bad cells and decoder interaction problem

Checkerboard Failure – checks and detect for bad cells, decoder interaction problem.

Leakage Failure ( Optional) – checks and detect one and shorts on all control an data pins, and memory cell leaks.

Pre-heat Test Failure– checks and detects reliability during chip warming –up.

Voltage bouncing test – check and detect modules with noise related problem

Loop Test Failure– to simulate module burn-in situation

.

For SDRAM Testing:
In addition to the above patterns, the following are found only in SDRAM testing mode :
Burst test failure - checks for faulty chip that fail to read and write during consecutive clock cycles.
Chip select test - checks for assembly shorts and open on the CS pins
DQM failure test - checks for shorts and open on the SDRAM chip input and output masking ability
WP fail test - check for module that is PC-100 Intel compliance.

*If your module is a known good module that works on the computer- but fail on the Eureka, it might be caused by a worn out test socket , defective test adapter, or a Calibration is due.

Contact CST for an RMA number if you have tried all the above.

Q. Why does the Eureka detects my PC100 DIMM as a PC66 ?

A. Check the chip marking on the module – a PC100 DIMM should have a “8” marking an the access time should be identify as 8ns not 10 or 12ns by the tester.

If you select the 100Mhz frequency – and preset the access time to 8ns and a DIMM module fail walk address/data , the module is not a PC100 compliance module. It could be a PC66 DIMM module.

If you select the 66 Mhz frequency – and preset the access time to 8ns and a DIMM module fail – walk address/data , the module speed should be set to 10 or 12ns to correctly test the module at 66Mhz.

Q. Why does the Eureka identify my DRAM module as 66ns when the marking on the chip indicates 60ns ?

A. Occasionally you might chance upon certain modules that the tester identify as eg 64ns instead of 60ns, this can be caused by several factors:

Signal degradation due to the chip loading effect on the SIMM or DIMM module, the result only happen to one or two types of module, typically with a sizable amount of chips mounted on board. If the timing is consistently high irregardless of type of module, then contact CST for RMA number to have your tester checked out.

Q. While testing SDRAM , the Eureka keep failing SPD test.

A. * If the “SPD data test” is selected in the test pattern , the tester will perform a SPD read and write comparison after functional test.
* If the original SPD data store in the tester buffer does not match the programmed SPD – the tester will fail “ SPD Data Test”. Ensure the SPD write compare enable function is enable from the” SPD Edit function”.
* Certain SDRAM DIMM modules are assembled with preprogrammed SPD EEPROM which are software write protected, you will not be able to reprogrammed this type of EEPROM again. Check with your supplier if you are not sure.
* Solder shorts on the SPD pins could also result in “Fail SPD Test”, perform a visual inspection on the SPD EEPROM leads.
* A defective EEPROM which is incapable of data retention – will also fail “SPD data test” . Try rewriting the SPD several times and it still fail- replace a new SPD EEPROM chip.

Q. The Eureka prompt “Hardware Interface error” ?

A. One possible cause – could be caused by a bad connection between the base tester and the Interface card. Check both the AC power cable and the Eureka interface capable.

Check the 3A fuse at the rear of the tester.

If error message persist, you need to contact CST for an RMA number

Q. The Eureka prompt “Data I/O failure” – when performing a self test ?

A. One possible cause – could be caused by a broken fuze from any of the 3 fuse on the Timing Board and the Driver motherboard.

If you have attended CST Training workshop – you can measure the fuse by using a ohmmeter. ( Caution only trained personnel are authorized to remove the casing for further troubleshooting).

Otherwise, please contact CST for an RMA number to send the Eureka for repair.


Q. Where can I get help on Memory module data specification and spd information

A. Please log onto www.simmtester.com >memory ? > techdata > for a list of technical data support page of existing standard modules data sheet and spd information click here Memory Module Tech Data support page

Q. Where can I get help on Memory module data specification and spd information

A. Please log onto www.simmtester.com >memory ? > techdata > for a list of technical data support page of existing standard modules data sheet and spd information click here Memory Module Tech Data support page

Q. Where can I obtain the latest software updates for the Eureka and related platforms ?

A. Please log onto www.simmtester.com >products> SP3000> software support page for the latest software update. click here for SP3000 software support

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